How do you validate luminance degradation at high temperature for wide-temp modules?
High-temperature luminance degradation is the reduction of emitted brightness when a module operates or dwells at elevated temperature. Part of
2026-02-02
High-temperature luminance degradation is the reduction of emitted brightness when a module operates or dwells at elevated temperature. Part of
Edge light leakage is unwanted brightness escaping near the module perimeter, often seen as bright bands, corner blooms, or uneven
Outgoing Quality Control (OQC) is the final quality gate before shipment. It targets shipment-critical escapes such as cosmetic defects, functional
An acceptable AG surface is not a single haze value. It is a practical balance between glare reduction, readable contrast,
A “line defect” is a linear artifact that may be a true row/column failure or a line-like effect caused by
A true line defect typically stays in the same pixel position across test patterns and normal viewing angles. If the
Brightness is only enforceable in procurement when test conditions are locked. Define what is measured (luminance at the display surface),
PVT deliverables prove production readiness: a locked build configuration, repeatable production-intent processes, and standardized quality evidence with stable yield. For
DVT deliverables are an evidence package: they freeze the validated design configuration and prove requirement coverage with traceable test plans,
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